BS PD ISO/TS 10867:2019

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This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs)using near infrared (NIR) photoluminescence (PL) spectroscopy.

It provides a measurement method for the determination of the chiral indices of the semi-conductingSWCNTs in a sample and their relative integrated PL intensities.

The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTsin a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

Cross References:
ISO/TS 80004-4
ISO/TS 80004-6

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:

12/13/2019

ISBN(s):

9780539034493

Number of Pages:

26

File Size:

1 file , 2.1 MB

Same As:

ISO/TS 10867:2019

Product Code(s):

30389138, 30389138, 30389138

Note:

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