BS CECC 20000:1983

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Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.

Cross References:
BS 1991
BS 2011:Part 1.1
BS 2011:Part 2.1B
BS 2011:Part 2.1Ca
BS 2011:Part 2.1Da
BS 2011:Part 2.1Db
BS 2011:Part 2.1Ea
BS 2011:Part 2.1Fc
BS 2011:Part 2.1Ga
BS 2011:Part 2.1N
BS 2011:Part 2.1Q
BS 2011:Part 2.1T
BS 2011:Part 2.1U
BS 2011:Part 2.1Z/AD
BS 2045
BS 3363
BS 3934
BS 3939
BS 4727:Part 4:Group 01
BS 5555
BS 6001
BS 9000:Part 2
BS 9300
BS E9007
ISO/R 2015
IEC 134
IEC 306

Replaced by BS EN 120000:1996 but remains current.

Incorporates the following:
AMD 4606 published 31 October 1984
AMD 5800 published 28 February 1989

Product Details

Published:

06/30/1983

ISBN(s):

0580119416

Number of Pages:

100

File Size:

1 file , 6.1 MB

Product Code(s):

00150331, 00150331, 00150331

Note:

This product is unavailable in United Kingdom