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BS PD IEC TS 62607-5-3:2020

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This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

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Product Details

Published:
04/22/2020
ISBN(s):
9780580991981
Number of Pages:
24
File Size:
1 file , 1.6 MB
Product Code(s):
30363345, 30363345, 30363345