BS CECC 00013:1985

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Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

Product Details

Published:

08/30/1985

ISBN(s):

0580146022

Number of Pages:

28

File Size:

1 file , 820 KB

Product Code(s):

00140153, 00140153, 00140153

Note:

This product is unavailable in United Kingdom