BS DD ENV 50219:1996

Click here to purchase
Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

Cross References:
CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- ‘Description of a Parametrized European Mini Test Chip’
CENELEC R 117- ‘Data Interchange Format for Simulated and Measured Data (ISMD)’
CENELEC ‘R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip’
CENELEC R 117- ‘Evaluation of the Reliability Test Structures of the European Mini Test Chip’

Product Details

Published:

09/15/1996

ISBN(s):

0580260372

Number of Pages:

42

File Size:

1 file , 980 KB

Product Code(s):

00835677, 00835677, 00835677

Note:

This product is unavailable in United Kingdom